Abstract
The efficient use of coherent X-rays is a crucial issue for ptychography at synchrotron facilities. We propose a method for optimizing the population of coherent modes for an optimal resolution. We show by a wave optical simulation that the intensity of a nearly diffraction-limited focusing X-ray beam can be described as an incoherent sum of a few orthogonal modes and that the first-mode flux significantly increases within a secondary source size by relaxing the requirement on the degree of coherence. We experimentally demonstrate it by means of multiple-mode ptychography with a synchrotron X-ray and achieve the high-resolution imaging of a weak-phase object. The present approach enables the high-resolution and high-throughput observation of weak-phase objects in materials science and biology.
Original language | English |
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Article number | 071103 |
Journal | Applied Physics Letters |
Volume | 108 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2016 Feb 15 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)