Efficient mapping of em radiation associated with information leakage for cryptographic devices

Haruki Shimada, Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, Laurent Sauvage, Jean Luc Danger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper presents an efficient map generation technique for evaluating the intensity of electromagnetic (EM) radiation associated with information leakage for cryptographic devices at the PCB level. First, we investigate the relation between the intensity of the overall EM radiation and the intensity of EM information leakage on a cryptographic device. For this purpose, we prepare a map of the magnetic field on the device by using an EM scanning system, after which we perform correlation electromagnetic analysis (CEMA) at all measurement points on the device, including points above the cryptographic module. The examined device is a standard evaluation board for cryptographic modules (SASEBO), where a cryptographic circuit is implemented on one of the FPGAs on the board. With this experiment, we demonstrate that an efficient map of EM radiation associated with information leakage can be generated on the basis of an EM radiation map. We also confirm that the generated map is in fair agreement with the corresponding map obtained from exhaustive CEMA.

Original languageEnglish
Title of host publicationEMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
Pages794-799
Number of pages6
DOIs
Publication statusPublished - 2012 Dec 12
Event2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012 - Pittsburgh, PA, United States
Duration: 2012 Aug 52012 Aug 10

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012
CountryUnited States
CityPittsburgh, PA
Period12/8/512/8/10

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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