Efficient approach to measure crystallization temperature in amorphous thin film by infrared reflectivity

Wenxiu Wang, Shin Saito, Hidetaka Yakabe, Migaku Takahashi

Research output: Contribution to journalArticlepeer-review

Abstract

This paper shows a new effective approach to measure crystallization temperature of soft magnetic underlayer (SUL) for next generation of heat assisted perpendicular recording media. This approach uses temperature dependent reflectivity, which shows a clear jump when samples are crystallized. To achieve this measurement, an optical system is set up using hot plate and infrared laser. Reflectivity of SUL (Co70Fe30)92Ta3Zr5 shows a clear jump at its amorphous-crystalline transition temperature. Experiment results show this effect is clear in infrared region, and is weak for visible light.

Original languageEnglish
Pages (from-to)86-89
Number of pages4
JournalJournal of Magnetics
Volume18
Issue number2
DOIs
Publication statusPublished - 2013 Jul 4

Keywords

  • Amorphous thin film
  • Optical property
  • Perpendicular recording media
  • Soft magnetic thin film

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Efficient approach to measure crystallization temperature in amorphous thin film by infrared reflectivity'. Together they form a unique fingerprint.

Cite this