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Effects of structural defects on hole drift mobility in aryl-substituted polysilanes
Shu Seki, Yoichi Yoshida, Seiichi Tagawa, Keisuke Asai, Kenkichi Ishigure, Kazuaki Furukawa, Michiya Fujikiand, Nobuo Matsumoto
Research output: Contribution to journal › Article › peer-review
55
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(Scopus)