Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfaces

N. Tanaka, S. Kato, T. Miyamoto, M. Nishiura, K. Tsumori, Y. Matsumoto, T. Kenmotsu, A. Okamoto, S. Kitajima, M. Sasao, M. Wada, H. Yamaoka

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Engineering & Materials Science

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