Abstract
We have investigated the effects of refraction of X-rays in double-crystal topography in the (+, -) Bragg-Bragg asymmetric arrangement, in which the angle of incidence of X-rays is very small. It is shown that in a double-crystal topograph of a sample having an uneven surface, the refraction effect gives rise to diffraction contrasts corresponding to the shape of the sample surface. This effect can be applied to an examination of surface roughness of a crystal and to a determination of a refractive index in the X-ray region. An attempt to derive the refractive index for silicon crystals has been made. The derived value was found to be in good agreement with the nominal one.
| Original language | English |
|---|---|
| Pages (from-to) | 849-854 |
| Number of pages | 6 |
| Journal | Japanese journal of applied physics |
| Volume | 27 |
| Issue number | 5R |
| DOIs | |
| Publication status | Published - 1988 May |
| Externally published | Yes |
Keywords
- Double-crystal method
- Refraction effect
- Refractive index
- Silicon
- Surface roughness
- X-ray topography
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)