Effects of nitride formation on the interface structures of Ni/C multilayers

S. Tamada, Y. Tsuchiya, N. Nakayama, K. Kosuge, S. Nagata, S. Yamaguchi

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Structures of Ni/C multilayered films prepared by Ar sputtering and reactive sputtering in pure N2 have been investigated using X-ray diffraction and RBS. The higher Bragg peak intensities of nitrided multilayers indicate the suppression of carbide formation at the Ni/C interfaces by nitriding particularly for carbon layers.

Original languageEnglish
Pages (from-to)164-166
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume126
Issue number1-3
DOIs
Publication statusPublished - 1993 Sep

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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