Effects of interface roughness on the local valence electronic structure at the SiO2/Si interface: Soft X-ray absorption and emission study

Y. Yamashita, S. Yamamoto, K. Mukai, J. Yoshinobu, Y. Harada, T. Tokushima, Y. Takata, S. Shin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

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Physics & Astronomy