Effects of grain boundary characters for secondary recrystallisation in grain oriented silicon steel

H. Homma, K. Murakami, T. Tamaki, N. Shibata, T. Yamamoto, Y. Ikuhara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The grain growth due to the orientation selectivity during the secondary recrystallisation has been intensively investigated for grain oriented silicon steels, however there still remain several points where common agreement is not obtained yet. Therefore the present paper reviews the arguments and examines the effect of grain boundary characters on this type of abnormal grain growth. So far, we have reported an important role of coherent boundaries, namely, the elucidated selective growth infers significant correlation of Σ9 type CSL orientation relationship between the growing grains and the expended grains in HI-B

Original languageEnglish
Title of host publicationRecrystallization and Grain Growth III - Proceedings of the Third International Conference on Recrystallization and Grain Growth, ReX and GG III
PublisherTrans Tech Publications Ltd
Pages633-640
Number of pages8
EditionPART 1
ISBN (Print)087849443X, 9780878494439
DOIs
Publication statusPublished - 2007 Jan 1
Externally publishedYes
Event3rd International Conference on Recrystallization and Grain Growth, ReX GG III - Jeju Island, Korea, Republic of
Duration: 2007 Jun 102007 Jun 15

Publication series

NameMaterials Science Forum
NumberPART 1
Volume558-559
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Other

Other3rd International Conference on Recrystallization and Grain Growth, ReX GG III
CountryKorea, Republic of
CityJeju Island
Period07/6/1007/6/15

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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