Abstract
Recently, the effect of dynamical electron diffraction on the phase shift in electromagnetic field analysis using transmission electron microscopy has become increasingly important. In the present study, we investigated the effect of dynamical electron diffraction on the phase shift in electron holograms recorded from a wedge-shaped specimen of single-crystal Si around a Bragg diffraction condition. The results show that the effective inner potential depends on the direction of the incident electron beam, especially near Bragg conditions. The characteristic phase shift was analyzed using dynamical electron diffraction theory (Bethe method).
Original language | English |
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Pages (from-to) | 2120-2124 |
Number of pages | 5 |
Journal | Materials Transactions |
Volume | 60 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2019 |
Keywords
- Dynamical electron diffraction
- Electron holography
- Phase shift
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering