Abstract
Dependence of thickness on the dielectric and ferroelectric characteristics were examined for Pb(Mg1/3Nb2/3)O3 (PMN) thin film prepared by sol-gel method. The films had stoichiometric composition and epitaxially grown on (100)Pt//(100)MgO substrate. Dialectric constant was decreased with the decrease of thickness, however, frequency dispersion of dielectric constant which is characteristic for relaxor was observed. P-E hysteresis was also observed for the PMN thin film, however, the remanent polarization was much smaller than the value reported for PMN bulk ceramics. These facts implies that size-effect are also observed for relaxor ferroelectrics.
Original language | English |
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Pages | 97-100 |
Number of pages | 4 |
Publication status | Published - 1998 Dec 1 |
Externally published | Yes |
Event | Proceedings of the 1998 11th IEEE International Symposium on Appliations of Ferroelectrics (ISAF-XI) - Montreaux, Switz Duration: 1998 Aug 24 → 1998 Aug 27 |
Other
Other | Proceedings of the 1998 11th IEEE International Symposium on Appliations of Ferroelectrics (ISAF-XI) |
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City | Montreaux, Switz |
Period | 98/8/24 → 98/8/27 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering