Effect of surface roughness and field annealing on interlayer coupling in MnIr-based magnetic tunnel junction

Dong Young Kim, Cheol Gi Kim, Chong Oh Kim, M. Tsunoda, Migaku Takahashi

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The interlayer coupling field (Hin) and coercivity (Hc) were measured using micro-optical Kerr effect, and the surface roughness was obtained by using atomic force microscopy (AFM) at different points across the patterned tunnel junction. Hin and Hc increase with greater surface roughness. This result shows that the enhanced coercivity (Hce) is linearly proportional to Hin such as Hce = α Hi n. Finally, the propositional constant α has been deduced from the annealing field dependence of Hin and Hce as the function of surface magnetization of pinned layer, α = ( Ms - Mps ) / Mps. From the results of Hin and Hce in magnetic tunnel junction (MTJ) multilayer, we can infer that the surface magnetization of pinned layer is due to the interfacial morphological corrugations.

Original languageEnglish
Pages (from-to)e267-e269
JournalJournal of Magnetism and Magnetic Materials
Volume304
Issue number1
DOIs
Publication statusPublished - 2006 Sep 1

Keywords

  • Enhanced coercivity
  • Interlayer coupling
  • Magnetic tunnel junction
  • Roughness

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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