Abstract
The effect of interface modification by insertion of Se layer on the formation of InAs dots on GaAs(001) is investigated by means of reflection high energy electron diffraction (RHEED) and atomic force microscope. The incorporation of a Se single layer into the interface is found to give rise to an extended critical thickness, presumably due to reduction of interface energy by the formation of Se-Ga/Se-In bonds. The reorganization of InAs supercritical 2D layers to form InAs dots on Se-treated GaAs(001) surface is reviewed by AFM images.
Original language | English |
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Pages (from-to) | 742-746 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 130-132 |
DOIs | |
Publication status | Published - 1998 |
Event | Proceedings of the 1997 4th International Symposium on Atomically Controlled Surfaces and Intefaces, ACSI-4 - Tokyo, Jpn Duration: 1997 Oct 27 → 1997 Oct 30 |
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films