Effect of surface film on the al whisker fabrication by utilizing stress migration

Yebo Lu, Masumi Saka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The effect of surface film on the Al whisker fabrication by utilizing stress migration was investigated. The sample was a thin aluminum film deposited on an oxidized silicon substrate and covered with a surface film. Aluminum oxide layer, silicon oxide layer and Cu oxide layer were used as the surface films. Al whiskers were obtained only in the samples with aluminum oxide layer and silicon oxide layer after heat treatment. It was found that both the brittle surface films and compressive stress determined the Al whisker growth.

Original languageEnglish
Title of host publicationManufacturing Technology
Pages110-113
Number of pages4
DOIs
Publication statusPublished - 2013
Event2012 International Conference on Manufacturing, Manufacturing 2012 - Macau, China
Duration: 2012 Nov 142012 Nov 15

Publication series

NameAdvanced Materials Research
Volume630
ISSN (Print)1022-6680

Other

Other2012 International Conference on Manufacturing, Manufacturing 2012
CountryChina
CityMacau
Period12/11/1412/11/15

Keywords

  • Aluminum
  • Stress migration
  • Surface film
  • Whisker

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Effect of surface film on the al whisker fabrication by utilizing stress migration'. Together they form a unique fingerprint.

Cite this