TY - GEN
T1 - Effect of surface film on the al whisker fabrication by utilizing stress migration
AU - Lu, Yebo
AU - Saka, Masumi
N1 - Copyright:
Copyright 2013 Elsevier B.V., All rights reserved.
PY - 2013
Y1 - 2013
N2 - The effect of surface film on the Al whisker fabrication by utilizing stress migration was investigated. The sample was a thin aluminum film deposited on an oxidized silicon substrate and covered with a surface film. Aluminum oxide layer, silicon oxide layer and Cu oxide layer were used as the surface films. Al whiskers were obtained only in the samples with aluminum oxide layer and silicon oxide layer after heat treatment. It was found that both the brittle surface films and compressive stress determined the Al whisker growth.
AB - The effect of surface film on the Al whisker fabrication by utilizing stress migration was investigated. The sample was a thin aluminum film deposited on an oxidized silicon substrate and covered with a surface film. Aluminum oxide layer, silicon oxide layer and Cu oxide layer were used as the surface films. Al whiskers were obtained only in the samples with aluminum oxide layer and silicon oxide layer after heat treatment. It was found that both the brittle surface films and compressive stress determined the Al whisker growth.
KW - Aluminum
KW - Stress migration
KW - Surface film
KW - Whisker
UR - http://www.scopus.com/inward/record.url?scp=84873143784&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84873143784&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMR.630.110
DO - 10.4028/www.scientific.net/AMR.630.110
M3 - Conference contribution
AN - SCOPUS:84873143784
SN - 9783037855836
T3 - Advanced Materials Research
SP - 110
EP - 113
BT - Manufacturing Technology
T2 - 2012 International Conference on Manufacturing, Manufacturing 2012
Y2 - 14 November 2012 through 15 November 2012
ER -