Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method

Momoji Kubo, Kazumi Serizawa, Hiromi Kikuchi, Riadh Sahnoun, Michihisa Koyama, Hideyuki Tsuboi, Nozomu Hatakeyama, Akira Endou, Hiromitsu Takaba, Carlos A. Del Carpio, Hiroshi Kajiyama, Tsutae Shinoda, Akira Miyamoto

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Abstract

Our original molecular dynamics code was applied to the destruction dynamics of MgO protecting layer in the plasma display panel by Xe sputtering. The effect of surface contamination on the destruction and recrystallization dynamics of the MgO protecting layer was clarified. Especially, we elucidated that adsorbed water molecules are dissociated and hydrogen atoms are intruded into the MgO surface by Xe sputtering. These phenomena were suggested to degrade significantly the second electron emission ability of the MgO protecting layer.

Original languageEnglish
Pages787-790
Number of pages4
Publication statusPublished - 2007 Dec 1
Event14th International Display Workshops, IDW '07 - Sapporo, Japan
Duration: 2007 Dec 52007 Dec 5

Other

Other14th International Display Workshops, IDW '07
CountryJapan
CitySapporo
Period07/12/507/12/5

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging
  • Atomic and Molecular Physics, and Optics

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    Kubo, M., Serizawa, K., Kikuchi, H., Sahnoun, R., Koyama, M., Tsuboi, H., Hatakeyama, N., Endou, A., Takaba, H., Del Carpio, C. A., Kajiyama, H., Shinoda, T., & Miyamoto, A. (2007). Effect of surface contamination on destruction and recrystallization dynamics of MgO protecting layer in plasma display panel by molecular dynamics simulation method. 787-790. Paper presented at 14th International Display Workshops, IDW '07, Sapporo, Japan.