Abstract
We report on molecular-beam epitaxy (MBE) of Mn-doped GaAs films grown at relatively high temperatures and their properties. The samples were grown at 400, 450, 530, and 560 °C and their growth fronts were monitored by in situ reflection high-energy electron diffraction (RHEED) during the entire growth. From the RHEED pattern, we found that the maximum doping composition of Mn is subpercent at these temperatures. The RHEED pattern and the surface morphology of the samples grown at 400 and 450 °C were influenced strongly by As overpressure and Mn doping.
Original language | English |
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Pages (from-to) | 264-267 |
Number of pages | 4 |
Journal | Journal of Crystal Growth |
Volume | 301-302 |
Issue number | SPEC. ISS. |
DOIs | |
Publication status | Published - 2007 Apr |
Keywords
- A1. RHEED
- A3. High-temperature growth
- A3. Molecular beam epitaxy
- B1. (Ga,Mn)As
- B2. Diluted magnetic semiconductor
- B2. III-V semiconductor
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry