Abstract
Crystallization of molten mold flux film has been observed using a confocal scanning laser microscope (CSLM) with an infrared furnace. The observation has indicated that mold flux of larger basicity (CaO/SiO2 = 1.41) starts crystallizing directly in liquid phase at temperatures >1373 K, and shows a faster growth rate of crystalline than that of smaller basicity (CaO/SiO2 = 0.96). Cross-section of solidified fluxes shows that the shrinkage due to the crystallization is more for larger basicity flux than for smaller one. This difference implies that thermal resistance at mold/mold flux film interface arises from the solidification and crystallization of the flux film.
Original language | English |
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Pages (from-to) | 110-117 |
Number of pages | 8 |
Journal | Journal of Non-Crystalline Solids |
Volume | 282 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2001 Apr 1 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry