Effect of resistance at contact boundary of loose connector on electromagnetic radiation

Kazuki Matsuda, Yu Ichi Hayashi, Takaaki Mizuki, Hideaki Sone

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Recently, for the electrical devices operating at high frequency, suppression of electromagnetic radiation field at high-frequency bands is required under EMC guidelines. EMC test measurements and suppression methods for electromagnetic radiation generated at high-frequency bands are under investigation. But, discussion on the electromagnetic radiation resulting from interconnected devices is limited. So, we focus on an effect of connectors which decreases contact performance on electromagnetic radiation when devices are interconnected with each other. In previous studies, we have shown the effect of loose contact of a connector on electromagnetic radiation. These studies have shown that inductance and resistance value at a connector contact boundary are increased by loosening a connector and electromagnetic radiation is increased by changes of values of those high-frequency circuit elements. To investigate the mechanism of increase on electromagnetic radiation field by loose contact connector, we analyze the dominant element of high-frequency circuit to cause electromagnetic radiation. Moreover, to acquire contact requirements for a connector in order to suppress electromagnetic radiation, we compare the impact of inductance and resistance on electromagnetic radiation under different frequencies.

Original languageEnglish
Title of host publication26th International Conference on Electrical Contacts, ICEC 2012
Pages422-425
Number of pages4
Edition605 CP
DOIs
Publication statusPublished - 2012 Dec 1
Event26th International Conference on Electrical Contacts, ICEC 2012 - Beijing, China
Duration: 2012 May 142012 May 17

Publication series

NameIET Conference Publications
Number605 CP
Volume2012

Other

Other26th International Conference on Electrical Contacts, ICEC 2012
CountryChina
CityBeijing
Period12/5/1412/5/17

Keywords

  • Common-mode current
  • Electromagnetic radiation
  • Loose contact
  • SMA connector
  • TDR

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Matsuda, K., Hayashi, Y. I., Mizuki, T., & Sone, H. (2012). Effect of resistance at contact boundary of loose connector on electromagnetic radiation. In 26th International Conference on Electrical Contacts, ICEC 2012 (605 CP ed., pp. 422-425). (IET Conference Publications; Vol. 2012, No. 605 CP). https://doi.org/10.1049/cp.2012.0688