Abstract
The effect of purity on the fabrication of Al micro/thin-materials (MTMs) by utilizing electromigration (EM) has been investigated. The samples that were used to fabricate the Al MTMs were passivated polycrystalline Al lines incorporating a slit and small holes at the anode end of each sample. Al materials of different purity, 99% (2 N) and 99.99% (4 N), were used, and it was found that the atomic flux of the 2 N sample was significantly larger than that of the 4 N sample, leading to the enhanced fabrication of Al MTMs due to EM under the same experimental conditions, which turned out to be related to a decrease in the activation energy for grain boundary diffusion.
| Original language | English |
|---|---|
| Pages (from-to) | 2294-2296 |
| Number of pages | 3 |
| Journal | Materials Letters |
| Volume | 63 |
| Issue number | 27 |
| DOIs | |
| Publication status | Published - 2009 Nov 15 |
Keywords
- Activation energy
- Electromigration
- Micro/thin-materials
- Purity
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering