Effect of multimode and single-mode microwave processing of anisotropic grain growth of CuFeO 2

Jun Fukushima, Hirotsugu Takiawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

the authors verified an anisotropic grain growth mechanism of CuFeO 2 in microwave processing by comparative experiments using multimode and single-mode microwave irradiation furnace. Anisotropic grain growth of CuFeO 2 was promoted in multimode processing with continuous wave, but not with pulse wave. On the other hand, in single-mode processing, pulse wave was promoted anisotropic grain growth. In microwave E-field irradiation, it is considered that anisotropic grain growth was promoted by increasing the solid phase diffusion due to electric fields increase around the powder interface. In microwave H-field irradiation, it is considered that local heating around the powder interface resulted in diffusion promotion and anisotropic grain growth was occurred.

Original languageEnglish
Title of host publication2018 Asia-Pacific Microwave Conference, APMC 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1630-1632
Number of pages3
ISBN (Electronic)9784902339451
DOIs
Publication statusPublished - 2019 Jan 16
Event30th Asia-Pacific Microwave Conference, APMC 2018 - Kyoto, Japan
Duration: 2018 Nov 62018 Nov 9

Publication series

NameAsia-Pacific Microwave Conference Proceedings, APMC
Volume2018-November

Conference

Conference30th Asia-Pacific Microwave Conference, APMC 2018
CountryJapan
CityKyoto
Period18/11/618/11/9

Keywords

  • Diffusion processes
  • Magnetic materials
  • Materials processing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Fukushima, J., & Takiawa, H. (2019). Effect of multimode and single-mode microwave processing of anisotropic grain growth of CuFeO 2 In 2018 Asia-Pacific Microwave Conference, APMC 2018 - Proceedings (pp. 1630-1632). [8617648] (Asia-Pacific Microwave Conference Proceedings, APMC; Vol. 2018-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/APMC.2018.8617648