Effect of grain size and texture on pseudoelasticity in Cu-Al-Mn-based shape memory wire

Y. Sutou, T. Omori, K. Yamauchi, N. Ono, R. Kainuma, K. Ishida

Research output: Contribution to journalArticle

184 Citations (Scopus)

Abstract

The effect of the relative grain size d/D (d: grain size, D: wire diameter) on stress-strain characteristics was investigated in Cu-Al-Mn-based shape memory alloy (SMA) wires. The yield stress (σy), the work-hardening rate after yielding (dσPE/dε) and the stress hysteresis (Δσ) in the wires with a random texture decrease with increasing d/D. The transformation strain (εTS) and the maximum pseudoelastic strain (εPEMAX) increase with increasing d/D. The effect of grain size on pseudoelastic behaviors can be clarified from the volume fraction of three-dimensionally constrained grains and the σy, dσPE/dε and Δσ increase proportionally with increasing (1 - (d/D))2 while the εTS decreases proportionally with increasing (1 - (d/D))2. Consequently, the effect of grain size on the pseudoelastic behaviors can be expressed using the Taylor and inverse Schmid factors. The σy and the εTS for wires with a 〈1 1 0〉 fiber texture are larger and smaller than those for wires with a random texture, respectively.

Original languageEnglish
Pages (from-to)4121-4133
Number of pages13
JournalActa Materialia
Volume53
Issue number15
DOIs
Publication statusPublished - 2005 Sep 1

Keywords

  • Cu-Al-Mn alloy
  • Martensitic phase transformation
  • Modelling
  • Shape memory alloys
  • Texture

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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