Effect of external stress on polarization in ferroelectric thin films

Tetsuo Kumazawa, Yukihiro Kumagai, Hideo Miura, Makoto Kitano, Keiko Kushida

Research output: Contribution to journalArticlepeer-review

110 Citations (Scopus)


The polarization changes caused by applying mechanical stresses to a lead zirconate titanate (PZT) thin film were investigated. Both the remnant and spontaneous polarizations decreased when the PZT film was loaded with tensile stress. For compressive stresses, the remnant polarization increased, but spontaneous polarization did not change. In fatigue with tensile stress state, the polarization decreased earlier than when there was no stress, which depend on whether or not the initial polarization value was high. Conversely, in fatigue with compressive stress, the initial higher remnant polarization value was maintained compared with the polarization in the unstress condition.

Original languageEnglish
Pages (from-to)608-610
Number of pages3
JournalApplied Physics Letters
Issue number5
Publication statusPublished - 1998
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


Dive into the research topics of 'Effect of external stress on polarization in ferroelectric thin films'. Together they form a unique fingerprint.

Cite this