Effect of exchange coupling of polycrystalline antiferromagnetic layers on the magnetization process of soft magnetic layers

H. Fujiwara, C. Hou, M. Sun, H. S. Cho, K. Nishioka

Research output: Contribution to journalConference articlepeer-review

Abstract

A comprehensive explanation is given about the effect of the exchange coupling of polycrystalline AF-layers on the magnetization process of soft F-layers. Emphasis is on the complementary nature of exchange bias field and coercivity along with the role of AF-spin-fanning effect along the thickness direction and the rotational nature of the magnetization reversal process.

Original languageEnglish
Pages (from-to)GD-01
JournalDigests of the Intermag Conference
Publication statusPublished - 1999 Dec 1
Externally publishedYes
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: 1999 May 181999 May 21

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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