TY - JOUR
T1 - Effect of deposition temperature on the superconducting properties of Y-Ba-Cu-O films prepared by CVD
AU - Yamane, Hisanori
AU - Kurosawa, Hideyuki
AU - Hirai, Toshio
AU - Watanabe, Kazuo
AU - Iwasaki, Hideo
AU - Kobayashi, Norio
AU - Muto, Yoshio
N1 - Funding Information:
We wish to thank K. Saito of the Faculty for Development Research of Advanced Materials, IMR, Tohoku University, for his help of XRD measurement with a high intensity X-ray generator (Rigaku RAD-RC). This research was supported, in part, by Grant-in-Aid for Encouragement of Young Scientist from the Ministry of Education, Science and Culture, under contract No. 63750764.
PY - 1989/12
Y1 - 1989/12
N2 - The relationship between CVD deposition temperature and the resulting deposit's crystallinity and superconducting characteristics was examined for Y-Ba-Cu-O films prepared on SrTiO3 (100) single-crystal substrates. The source materials used in the CVD process were β-diketone metal chelates. The crystallinity was evaluated from an integral width of a (007) X-ray diffraction peak of YBa2Cu3O7-x deposited at 600-900°C. The films deposited at 750-900°C showed not only a higher crystallinity level than that of the films deposited at 600-700°C but also exhibited superconductivity. The highest level of crystallinity, the highest zero-resistance (Tc = 91.5 K) and the highest critical-current density (3.9 × 105 A/cm2) at 77.3 K and 0 T were measured for the film deposited a 850°C. This film consisted of mostly c-axis oriented grains with a few a-axis oriented grains.
AB - The relationship between CVD deposition temperature and the resulting deposit's crystallinity and superconducting characteristics was examined for Y-Ba-Cu-O films prepared on SrTiO3 (100) single-crystal substrates. The source materials used in the CVD process were β-diketone metal chelates. The crystallinity was evaluated from an integral width of a (007) X-ray diffraction peak of YBa2Cu3O7-x deposited at 600-900°C. The films deposited at 750-900°C showed not only a higher crystallinity level than that of the films deposited at 600-700°C but also exhibited superconductivity. The highest level of crystallinity, the highest zero-resistance (Tc = 91.5 K) and the highest critical-current density (3.9 × 105 A/cm2) at 77.3 K and 0 T were measured for the film deposited a 850°C. This film consisted of mostly c-axis oriented grains with a few a-axis oriented grains.
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U2 - 10.1016/0022-0248(89)90331-X
DO - 10.1016/0022-0248(89)90331-X
M3 - Article
AN - SCOPUS:0024883216
VL - 98
SP - 860
EP - 866
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
SN - 0022-0248
IS - 4
ER -