Effect of DC bias current on sensitivity of thin-film magnetoimpedance element

C. Sumida, H. Kikuchi, S. Hashi, K. Ishiyama, T. Nakai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Magnetoimpedance (MI) sensor is commercially applied for compasses in mobile phones [1], and its sensitivity has been enhanced to be applicable to biomedical research field and nondestructive testing [2].

Original languageEnglish
Title of host publication2017 IEEE International Magnetics Conference, INTERMAG 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538610862
DOIs
Publication statusPublished - 2017 Aug 10
Event2017 IEEE International Magnetics Conference, INTERMAG 2017 - Dublin, Ireland
Duration: 2017 Apr 242017 Apr 28

Publication series

Name2017 IEEE International Magnetics Conference, INTERMAG 2017

Other

Other2017 IEEE International Magnetics Conference, INTERMAG 2017
CountryIreland
CityDublin
Period17/4/2417/4/28

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Effect of DC bias current on sensitivity of thin-film magnetoimpedance element'. Together they form a unique fingerprint.

  • Cite this

    Sumida, C., Kikuchi, H., Hashi, S., Ishiyama, K., & Nakai, T. (2017). Effect of DC bias current on sensitivity of thin-film magnetoimpedance element. In 2017 IEEE International Magnetics Conference, INTERMAG 2017 [8007906] (2017 IEEE International Magnetics Conference, INTERMAG 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2017.8007906