Abstract
The authors investigated the evolution of surface morphology of AlN films grown on ZnO substrates at low temperature (LT) (400 °C) as a function of anion/cation supplying ratio (V/III ratio). Unlike the well-known favorable growth conditions for high-temperature growth, smooth-surface LT-AlN layers were obtained under the O-polar surface, stoichiometric, and N-rich conditions. LT-AlN layers revealed smooth surface (roughness in root mean square=0.20 nm for AlN on O-polar ZnO and 0.44 nm for AlN on Zn-polar ZnO) and quite low etch-pit density (∼2× 106 cm-2 for AlN/Zn -polar ZnO).
Original language | English |
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Pages (from-to) | 61-64 |
Number of pages | 4 |
Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
Volume | 28 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2010 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films