Edge-illumination x-ray phase contrast imaging with Pt-based metallic glass masks

Somayeh Saghamanesh, Seyed Mahmoud Reza Aghamiri, Alessandro Olivo, Maryam Sadeghilarijani, Hidemi Kato, Alireza Kamali-Asl, Wataru Yashiro

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Edge-illumination x-ray phase contrast imaging (EI XPCI) is a non-interferometric phase-sensitive method where two absorption masks are employed. These masks are fabricated through a photolithography process followed by electroplating which is challenging in terms of yield as well as time- and cost-effectiveness. We report on the first implementation of EI XPCI with Pt-based metallic glass masks fabricated by an imprinting method. The new tested alloy exhibits good characteristics including high workability beside high x-ray attenuation. The fabrication process is easy and cheap, and can produce large-size masks for high x-ray energies within minutes. Imaging experiments show a good quality phase image, which confirms the potential of these masks to make the EI XPCI technique widely available and affordable.

Original languageEnglish
Article number063705
JournalReview of Scientific Instruments
Volume88
Issue number6
DOIs
Publication statusPublished - 2017 Jun 1

ASJC Scopus subject areas

  • Instrumentation

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