Edge-defined film-fed (EFG) growth of rare-earth orthovanadates REVO4 (RE = Y, Gd): Interface morphology effect on crystal shape and material properties

Boris M. Epelbaum, Kiyoshi Shimamura, Katsuhiko Inaba, Satoshi Uda, Vladimir V. Kochurikhin, Hiroshi Machida, Yasuko Terada, Tsuguo Fukuda

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

The transparent rod-like macro-defect-free single crystals of YVO4 and GdVO4 have been successfully grown by EFG technique. Basic properties of EFG crystals have been investigated in connection with growth interface morphology. The origin of asymmetric radial growth phenomena for both EFG and CZ growth of REVO4 is discussed. Finally, the quality of EFG crystals is marked as comparable to CZ crystals.

Original languageEnglish
Pages (from-to)607-611
Number of pages5
JournalJournal of Crystal Growth
Volume186
Issue number4
DOIs
Publication statusPublished - 1998 Mar 7
Externally publishedYes

Keywords

  • EFG method
  • Faceting
  • Interface stability
  • Melt
  • Properties
  • Rare-earth orthovanadate
  • Shaped crystal growth
  • Structure

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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