Dynamics of single-electron capture in Si nanowire MOSFETs

Akira Fujiwara; Satoru Miyamoto; Katsuhiko Nishiguchi; Yukinori Ono; N. M. Zimmerman

doi:10.1109/SNW.2008.5418469

Dynamics of single-electron capture in Si nanowire MOSFETs

Akira Fujiwara, Satoru Miyamoto, Katsuhiko Nishiguchi, Yukinori Ono, N. M. Zimmerman

SCI - Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Original language	English
Title of host publication	IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008
DOIs	https://doi.org/10.1109/SNW.2008.5418469
Publication status	Published - 2008 Dec 1
Event	IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008 - Honolulu, HI, United States Duration: 2008 Jun 15 → 2008 Jun 16

Other

Other	IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008
Country/Territory	United States
City	Honolulu, HI
Period	08/6/15 → 08/6/16

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/SNW.2008.5418469

Cite this

@inproceedings{a8c5c56e96514456ab15952cc7a643a1,

title = "Dynamics of single-electron capture in Si nanowire MOSFETs",

author = "Akira Fujiwara and Satoru Miyamoto and Katsuhiko Nishiguchi and Yukinori Ono and Zimmerman, {N. M.}",

year = "2008",

month = dec,

day = "1",

doi = "10.1109/SNW.2008.5418469",

language = "English",

isbn = "9781424420711",

booktitle = "IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008",

note = "IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008 ; Conference date: 15-06-2008 Through 16-06-2008",

}

TY - GEN

T1 - Dynamics of single-electron capture in Si nanowire MOSFETs

AU - Fujiwara, Akira

AU - Miyamoto, Satoru

AU - Nishiguchi, Katsuhiko

AU - Ono, Yukinori

AU - Zimmerman, N. M.

PY - 2008/12/1

Y1 - 2008/12/1

UR - http://www.scopus.com/inward/record.url?scp=77949968254&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77949968254&partnerID=8YFLogxK

U2 - 10.1109/SNW.2008.5418469

DO - 10.1109/SNW.2008.5418469

M3 - Conference contribution

AN - SCOPUS:77949968254

SN - 9781424420711

BT - IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008

T2 - IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008

Y2 - 15 June 2008 through 16 June 2008

ER -

Dynamics of single-electron capture in Si nanowire MOSFETs

Other

ASJC Scopus subject areas

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