Dynamical elemental mapping at elevated temperature using plasmon loss peaks in electron energy loss spectroscopy

K. Sasaki, S. Tsukimoto, M. Konnno, T. Kamino, H. Saka

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Dynamic elemental mapping was carried out during an in-situ heating experiment in a transmission electron microscope using plasmon loss peaks in electron energy loss spectroscopy. Migration of oxygen near an interface between Si and SiO2 during the reducing reaction SiO2→Si + O2 was studied by this method.

    Original languageEnglish
    Pages (from-to)338-342
    Number of pages5
    JournalNippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
    Volume65
    Issue number5
    DOIs
    Publication statusPublished - 2001

    Keywords

    • Electron energy loss spectroscopy
    • Energy filter
    • In-situ observation
    • Interface vibration
    • Plasmon image
    • Plasmon loss
    • Transmission electron microscopy

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Mechanics of Materials
    • Metals and Alloys
    • Materials Chemistry

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