Abstract
Dynamic elemental mapping was carried out during an in-situ heating experiment in a transmission electron microscope using plasmon loss peaks in electron energy loss spectroscopy. Migration of oxygen near an interface between Si and SiO2 during the reducing reaction SiO2→Si + O2 was studied by this method.
Original language | English |
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Pages (from-to) | 338-342 |
Number of pages | 5 |
Journal | Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals |
Volume | 65 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2001 |
Keywords
- Electron energy loss spectroscopy
- Energy filter
- In-situ observation
- Interface vibration
- Plasmon image
- Plasmon loss
- Transmission electron microscopy
ASJC Scopus subject areas
- Condensed Matter Physics
- Mechanics of Materials
- Metals and Alloys
- Materials Chemistry