Dynamical elemental mapping at elevated temperature using plasmon loss peaks in electron energy loss spectroscopy

K. Sasaki; S. Tsukimoto; M. Konnno; T. Kamino; H. Saka

doi:10.2320/jinstmet1952.65.5_338

Dynamical elemental mapping at elevated temperature using plasmon loss peaks in electron energy loss spectroscopy

K. Sasaki, S. Tsukimoto, M. Konnno, T. Kamino, H. Saka

Research output: Contribution to journal › Article › peer-review

Abstract

Dynamic elemental mapping was carried out during an in-situ heating experiment in a transmission electron microscope using plasmon loss peaks in electron energy loss spectroscopy. Migration of oxygen near an interface between Si and SiO₂ during the reducing reaction SiO₂→Si + O₂ was studied by this method.

Original language	English
Pages (from-to)	338-342
Number of pages	5
Journal	Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Volume	65
Issue number	5
DOIs	https://doi.org/10.2320/jinstmet1952.65.5_338
Publication status	Published - 2001

Keywords

Electron energy loss spectroscopy
Energy filter
In-situ observation
Interface vibration
Plasmon image
Plasmon loss
Transmission electron microscopy

ASJC Scopus subject areas

Condensed Matter Physics
Mechanics of Materials
Metals and Alloys
Materials Chemistry

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title = "Dynamical elemental mapping at elevated temperature using plasmon loss peaks in electron energy loss spectroscopy",

abstract = "Dynamic elemental mapping was carried out during an in-situ heating experiment in a transmission electron microscope using plasmon loss peaks in electron energy loss spectroscopy. Migration of oxygen near an interface between Si and SiO2 during the reducing reaction SiO2→Si + O2 was studied by this method.",

keywords = "Electron energy loss spectroscopy, Energy filter, In-situ observation, Interface vibration, Plasmon image, Plasmon loss, Transmission electron microscopy",

author = "K. Sasaki and S. Tsukimoto and M. Konnno and T. Kamino and H. Saka",

year = "2001",

doi = "10.2320/jinstmet1952.65.5_338",

language = "English",

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T1 - Dynamical elemental mapping at elevated temperature using plasmon loss peaks in electron energy loss spectroscopy

AU - Sasaki, K.

AU - Tsukimoto, S.

AU - Konnno, M.

AU - Kamino, T.

AU - Saka, H.

PY - 2001

Y1 - 2001

N2 - Dynamic elemental mapping was carried out during an in-situ heating experiment in a transmission electron microscope using plasmon loss peaks in electron energy loss spectroscopy. Migration of oxygen near an interface between Si and SiO2 during the reducing reaction SiO2→Si + O2 was studied by this method.

AB - Dynamic elemental mapping was carried out during an in-situ heating experiment in a transmission electron microscope using plasmon loss peaks in electron energy loss spectroscopy. Migration of oxygen near an interface between Si and SiO2 during the reducing reaction SiO2→Si + O2 was studied by this method.

KW - Electron energy loss spectroscopy

KW - Energy filter

KW - In-situ observation

KW - Interface vibration

KW - Plasmon image

KW - Plasmon loss

KW - Transmission electron microscopy

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EP - 342

JO - Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals

JF - Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals

SN - 0021-4876

IS - 5

ER -

Dynamical elemental mapping at elevated temperature using plasmon loss peaks in electron energy loss spectroscopy

Abstract

Keywords

ASJC Scopus subject areas

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