Dynamic mode force microscopy for the detection of lateral and vertical electrostatic forces

S. Watanabe, K. Hane, M. Ito, T. Goto

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

In this letter, a variant of scanning force microscope for detecting attractive forces is reported. The force gradients of the attractive forces acting in two orthogonal directions were detected simultaneously from the resonant frequency shifts of a cantilever oscillating in two directions. Using the fine electrode sample, the distributions of the electrostatic forces acting in lateral and vertical directions were visualized separately.

Original languageEnglish
Pages (from-to)2573-2575
Number of pages3
JournalApplied Physics Letters
Volume63
Issue number18
DOIs
Publication statusPublished - 1993 Dec 1
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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