Abstract
The current instability in pentacene organic thin film transistors (OTFTs) under dynamic bias stress was investigated. Current instability is strongly influenced by pulse duty ratio and pulse on-period and off-period voltages, but is independent of pulse frequency. A stable on-current without current instability was achieved by controlling the pulse duty ratio and pulse voltage. On the basis of the experimental results, a reversible transition model of dynamic charge trapping and detrapping in pentacene OTFTs is proposed, and trapping and detrapping time constants were estimated.
Original language | English |
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Article number | 213302 |
Journal | Applied Physics Letters |
Volume | 93 |
Issue number | 21 |
DOIs | |
Publication status | Published - 2008 Dec 8 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)