Dual-wavelength reflectance-ratio (DWR) method applied to high-temperature metals

Hidekazu Kobatake, Yuma Kurokawa, Hiroyuki Fukuyama, Naohiko Sasajima, Yu Yamaguchi, Yoshiro Yamada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Applicability of the dual-wavelength reflectance-ratio (DWR) method to high-temperature spherical metals was investigated. Solid nickel, copper and platinum spheres were used as samples for establishing the experimental setup and procedure. The samples were heated inductively and their temperatures were monitored with a thermocouple attached to the sample. Their radiances were measured using a pyrometer at two different wavelengths, 900 and 1350 nm. Their temperatures were calculated by analyzing the sample radiances with and without reflection of an auxiliary light source. The obtained temperatures by the DWR method agreed with the temperatures measured by a thermocouple within 50 K in the temperature range from 850 to 1600 K.

Original languageEnglish
Title of host publication2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages427-428
Number of pages2
ISBN (Electronic)9784907764579
DOIs
Publication statusPublished - 2017 Nov 10
Event56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017 - Kanazawa, Japan
Duration: 2017 Sep 192017 Sep 22

Publication series

Name2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
Volume2017-November

Other

Other56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
CountryJapan
CityKanazawa
Period17/9/1917/9/22

Keywords

  • Dual-wavelength reflectance-ratio method
  • High-temperature metals
  • emissivity-free radiation thermometry

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Optimization
  • Control and Systems Engineering
  • Instrumentation

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