DSP SYNTHESIZED SIGNAL SOURCE FOR ANALOG TESTING STIMULUS AND NEW TEST METHOD.

H. Kitayoshi, S. Sumiea, K. Siirakawa, S. Takeshita

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

A new testing method, associated with a new signal source optimized for FFT (fast Fourier transform) analysis, has realized the transfer function of an analog DUT (device under test) in an audio frequency band (0-100 kHz) over a wide dynamic range of 120 dB and with high precision of plus or minus 0. 002 dB and plus or minus 0. 02 degree . The method also estimated the transfer function at 400 points at speeds ranging from several tens of ms to several hundreds of ms.

Original languageEnglish
Title of host publicationDigest of Papers - International Test Conference
PublisherIEEE
Pages825-834
Number of pages10
ISBN (Print)081860641X
Publication statusPublished - 1985 Dec 1

Publication series

NameDigest of Papers - International Test Conference
ISSN (Print)0743-1686

ASJC Scopus subject areas

  • Engineering(all)

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