A new testing method, associated with a new signal source optimized for FFT (fast Fourier transform) analysis, has realized the transfer function of an analog DUT (device under test) in an audio frequency band (0-100 kHz) over a wide dynamic range of 120 dB and with high precision of plus or minus 0. 002 dB and plus or minus 0. 02 degree . The method also estimated the transfer function at 400 points at speeds ranging from several tens of ms to several hundreds of ms.
|Title of host publication||Digest of Papers - International Test Conference|
|Number of pages||10|
|Publication status||Published - 1985 Dec 1|
|Name||Digest of Papers - International Test Conference|
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