Domain wall in (FeCo)-Zr-O thin film profiled by spin-polarized scanning tunneling microscopy

Youhui Gao, Daisuke Shindo, Shigehiro Ohnuma, Hiroyasu Fujimori

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

The domain structure of (FeCo)-Zr-O thin film was observed with spin-polarized scanning tunneling microscopy. A maze domain is characterized by a domain width of about 320 nm, and a wall energy of 4.97 erg cm-2. The tunneling magnetoresistance (TMR) profile is fitted by a tanh function, and a wall thickness of about 100 nm is obtained. This indicates that the TMR is proportional to the angle between the tip and the film magnetizations. Effective exchange and anisotropy constants are estimated at 3.88 × 10-6 erg cm-1 and 3.98 × 105 erg cm-3, respectively.

Original languageEnglish
Pages (from-to)574-577
Number of pages4
JournalScripta Materialia
Volume59
Issue number5
DOIs
Publication statusPublished - 2008 Sep 1

Keywords

  • (FeCo)-Zr-O thin film
  • Maze domain
  • Spin-polarized scanning tunneling microscopy (STM)

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

Fingerprint Dive into the research topics of 'Domain wall in (FeCo)-Zr-O thin film profiled by spin-polarized scanning tunneling microscopy'. Together they form a unique fingerprint.

Cite this