Domain wall in (FeCo)-Zr-O thin film profiled by spin-polarized scanning tunneling microscopy

Youhui Gao, Daisuke Shindo, Shigehiro Ohnuma, Hiroyasu Fujimori

    Research output: Contribution to journalArticlepeer-review

    1 Citation (Scopus)

    Abstract

    The domain structure of (FeCo)-Zr-O thin film was observed with spin-polarized scanning tunneling microscopy. A maze domain is characterized by a domain width of about 320 nm, and a wall energy of 4.97 erg cm-2. The tunneling magnetoresistance (TMR) profile is fitted by a tanh function, and a wall thickness of about 100 nm is obtained. This indicates that the TMR is proportional to the angle between the tip and the film magnetizations. Effective exchange and anisotropy constants are estimated at 3.88 × 10-6 erg cm-1 and 3.98 × 105 erg cm-3, respectively.

    Original languageEnglish
    Pages (from-to)574-577
    Number of pages4
    JournalScripta Materialia
    Volume59
    Issue number5
    DOIs
    Publication statusPublished - 2008 Sep 1

    Keywords

    • (FeCo)-Zr-O thin film
    • Maze domain
    • Spin-polarized scanning tunneling microscopy (STM)

    ASJC Scopus subject areas

    • Materials Science(all)
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering
    • Metals and Alloys

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