Domain Wall and Domain Structure of Amorphous Multilayered Films

N. Saito, Y. Shimada, T. Sakurai

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    Studies on the effects of nonmagnetic (SiO2) intermediate layers of various thicknesses in amorphous Co-Zr-Nb films are described. Both SiO2 and amorphous Co-Zr-Nb layers were formed by ion beam sputtering, and samples were annealed in rotating and dc magnetic fields to induce a uniaxial anisotropy. Domain wall and structure observations and coercivity measurements both indicated that as the nonmagnetic layer thickness b is increased, a transition from a multilayered to a single-layer film structure occurs at between 10 and 20 Å, while for b > 1000 Å the film loses its multilayered character.

    Original languageEnglish
    Pages (from-to)754-755
    Number of pages2
    JournalIEEE Translation Journal on Magnetics in Japan
    Volume1
    Issue number6
    DOIs
    Publication statusPublished - 1985 Sep

    ASJC Scopus subject areas

    • Engineering (miscellaneous)
    • Engineering(all)

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