Domain inversion with 0.8μ period by using a conductive AFM tip and its application to QPM-SHG devices

Makoto Minakata, Haruyuki Awano, Motohiro Ohtsuka, Futoshi Iwata, Tetsuo Taniuchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we demonstrate a newly developed domain inversion technique using the improved AFM which is possible to scan a wide area through a conductive AFM tip, and also a thin LiNbO3 substrate called "a terrace substrate" using a dicing saw. Fine domain inversion period with less than 0.8μm is obtained. A novel SHG blue laser is also demonstrated using the terrace substrate and the extended AFM domain inversion technique.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2010
Publication statusPublished - 2010 Dec 1
EventConference on Lasers and Electro-Optics, CLEO 2010 - San Jose, CA, United States
Duration: 2010 May 162010 May 21

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics, CLEO 2010
CountryUnited States
CitySan Jose, CA
Period10/5/1610/5/21

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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