Abstract
The bit-to-bit distribution of a critical current density for magnetic domain wall (DW) motion is studied using Co/Ni wires with various wire widths (ws). The distribution inherently decreases with the w, and the ratio of standard deviation to average is 9.8% for wires with w = 40 nm. It is found that a self-distribution within one device, which is evaluated through repeated measurement, is a dominant factor in the bit-to-bit distribution. Micromagnetic simulation reveals that the distribution originates from DW configuration, which varies with device size.
Original language | English |
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Article number | 17D508 |
Journal | Journal of Applied Physics |
Volume | 115 |
Issue number | 17 |
DOIs | |
Publication status | Published - 2014 May 7 |
ASJC Scopus subject areas
- Physics and Astronomy(all)