Distribution of critical current density for magnetic domain wall motion

S. Fukami; M. Yamanouchi; Y. Nakatani; K. J. Kim; T. Koyama; D. Chiba; S. Ikeda; N. Kasai; T. Ono; H. Ohno

doi:10.1063/1.4866394

Distribution of critical current density for magnetic domain wall motion

S. Fukami, M. Yamanouchi, Y. Nakatani, K. J. Kim, T. Koyama, D. Chiba, S. Ikeda, N. Kasai, T. Ono, H. Ohno

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

The bit-to-bit distribution of a critical current density for magnetic domain wall (DW) motion is studied using Co/Ni wires with various wire widths (ws). The distribution inherently decreases with the w, and the ratio of standard deviation to average is 9.8% for wires with w = 40 nm. It is found that a self-distribution within one device, which is evaluated through repeated measurement, is a dominant factor in the bit-to-bit distribution. Micromagnetic simulation reveals that the distribution originates from DW configuration, which varies with device size.

Original language	English
Article number	17D508
Journal	Journal of Applied Physics
Volume	115
Issue number	17
DOIs	https://doi.org/10.1063/1.4866394
Publication status	Published - 2014 May 7

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.4866394

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title = "Distribution of critical current density for magnetic domain wall motion",

abstract = "The bit-to-bit distribution of a critical current density for magnetic domain wall (DW) motion is studied using Co/Ni wires with various wire widths (ws). The distribution inherently decreases with the w, and the ratio of standard deviation to average is 9.8% for wires with w = 40 nm. It is found that a self-distribution within one device, which is evaluated through repeated measurement, is a dominant factor in the bit-to-bit distribution. Micromagnetic simulation reveals that the distribution originates from DW configuration, which varies with device size.",

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AU - Fukami, S.

AU - Yamanouchi, M.

AU - Nakatani, Y.

AU - Kim, K. J.

AU - Koyama, T.

AU - Chiba, D.

AU - Ikeda, S.

AU - Kasai, N.

AU - Ono, T.

AU - Ohno, H.

PY - 2014/5/7

Y1 - 2014/5/7

N2 - The bit-to-bit distribution of a critical current density for magnetic domain wall (DW) motion is studied using Co/Ni wires with various wire widths (ws). The distribution inherently decreases with the w, and the ratio of standard deviation to average is 9.8% for wires with w = 40 nm. It is found that a self-distribution within one device, which is evaluated through repeated measurement, is a dominant factor in the bit-to-bit distribution. Micromagnetic simulation reveals that the distribution originates from DW configuration, which varies with device size.

AB - The bit-to-bit distribution of a critical current density for magnetic domain wall (DW) motion is studied using Co/Ni wires with various wire widths (ws). The distribution inherently decreases with the w, and the ratio of standard deviation to average is 9.8% for wires with w = 40 nm. It is found that a self-distribution within one device, which is evaluated through repeated measurement, is a dominant factor in the bit-to-bit distribution. Micromagnetic simulation reveals that the distribution originates from DW configuration, which varies with device size.

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Distribution of critical current density for magnetic domain wall motion

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