Direct observation of the crystallization in EL organic thin films by total reflection X-ray diffractometer

Kenji Orita, Kouichi Hayashi, Toshihisa Horiuchi, Kazumi Matsushige

Research output: Contribution to journalArticlepeer-review

Abstract

The degradation of amorphous organic electroluminescent (EL) devices is generally assumed due to the crystallization enhanced by the Joule heat. Here, in order to reveal directly the structural changes in organic EL films during an annealing process, we performed first total reflection X-ray diffraction measurements for N,N′-diphenyl-N,N′-bis(3-methylphenyl)-[1,1′-biphenyl]-4, 4′-diamine (TPD) films vapor-deposited on SiO2 glass substrates. Atomic force microscopy (AFM) was also used to observe the morphological modifications through annealing. The X-ray data revealed that the TPD film remained amorphous below 100 °C, followed by a gradual change into crystalline during annealing. Moreover, combining this result with the AFM data, we found that there existed some relationship between morphological change and crystallization in the film.

Original languageEnglish
Pages (from-to)542-544
Number of pages3
JournalThin Solid Films
Volume281-282
Issue number1-2
DOIs
Publication statusPublished - 1996 Aug 1

Keywords

  • Atomic force microscopy
  • Crystallization
  • Luminescence
  • X-ray diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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