Direct observation of second-harmonic generation from crystalline particles in Ge-doped SiO2 glass films

T. Fujiwara, T. Sawada, Y. Benino, T. Komatsu, M. Takahashi, T. Yoko, J. Nishii

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The authors report what is, to our best knowledge, the first observation of second-harmonic generation (SHG) directly from the crystalline particles in Ge-doped SiO2 (Ge:SiO2) glass films. Ge:SiO2 glass films with approximately 5 μm thickness were fabricated by chemical vapor-phase deposition. X-ray diffraction (XRD) peaks at around 2θ=22° in thermally crystallized Ge:SiO2 films were observed, and obtained XRD patterns are exactly the same as those in ultraviolet-laser-poled Ge:SiO2 glasses. Using SHG microscopic technique with a Nd:YAG laser, it has been successfully found that SH emitting with 532 nm wavelength is observed directly from the crystalline particles induced in the crystallized films.

Original languageEnglish
Pages (from-to)1598-1606
Number of pages9
JournalOptics Express
Volume11
Issue number14
DOIs
Publication statusPublished - 2003 Jul
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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