Direct observation of pseudogap of SmB6 using ultrahigh-resolution photoemission spectroscopy

S. Souma, H. Kumigashira, T. Ito, T. Takahashi, S. Kunii

Research output: Contribution to journalConference article

18 Citations (Scopus)

Abstract

We have performed a temperature-dependent ultrahigh-resolution photoemission spectroscopy on SmB6 to study the "Kondo-insulator" nature. We found a sharp Sm 4f-derived peak about 18 meV away from EF and a pseudogap at EF at low temperature. The pseudogap is gradually filled-in by the transfer of spectral weight from the sharp peak at high temperatures. This indicates that the pseudogap is a Kondo-insulator gap originating in the hybridization between the Sm 4f states and the conduction electrons.

Original languageEnglish
Pages (from-to)329-330
Number of pages2
JournalPhysica B: Condensed Matter
Volume312-313
DOIs
Publication statusPublished - 2002 Mar 1
EventInternational Conference on Strongly Correlated Electrons - Ann Arbor, MI, United States
Duration: 2002 Aug 62002 Aug 6

Keywords

  • Kondo insulator
  • Photoemission spectroscopy
  • SmB

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Direct observation of pseudogap of SmB<sub>6</sub> using ultrahigh-resolution photoemission spectroscopy'. Together they form a unique fingerprint.

  • Cite this