Direct observation of HPL and DG structure in PS-b-PI thin film by transmission electron microscopy

Hae Woong Park, Kyuhyun Im, Bonghoon Chung, Moonhor Ree, Taihyun Chang, Koji Sawa, Hiroshi Jinnai

Research output: Contribution to journalArticlepeer-review

37 Citations (Scopus)

Abstract

The Hexagonal Perforated Lamellar (HPL) and double-gyroid (DG) structures of polystyrene-block-polyisoprene (PS-b-PT) thin films coated on mica and their coexistence were observed by Transmission Electron Microscopy (TEM). The TEM images show that PI domains are selectively stained and appear darker than the PS domains, and the layers of PS block are perforated by PI blocks. The glazing incidence small-angle X-ray scattering (GISAXS) patterns of PS-b-PT show a well-developed HPL and DG phases that are parallel to the substrate. The 3D images of the HPL structure obtained by TEMT shows that the perforations at the edge of the first layer reappears at the same position in the fourth layer. The coexistence of the two phases from the samples annealed at 120°C for 30h shows that the HPL and DG phase transition starts from the substrate.

Original languageEnglish
Pages (from-to)2603-2605
Number of pages3
JournalMacromolecules
Volume40
Issue number7
DOIs
Publication statusPublished - 2007 Apr 3
Externally publishedYes

ASJC Scopus subject areas

  • Organic Chemistry
  • Polymers and Plastics
  • Inorganic Chemistry
  • Materials Chemistry

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