Direct method of surface structure determination by Patterson analysis of correlated thermal diffuse scattering for Si(001)2×1

T. Abukawa, C. M. Wei, K. Yoshimura, S. Kono

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Fingerprint Dive into the research topics of 'Direct method of surface structure determination by Patterson analysis of correlated thermal diffuse scattering for Si(001)2×1'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy