A simple oscillatory intensity variation in medium-energy electron diffraction found recently [Abukawa et al., Phys. Rev. Lett. 82, 335 (1999)] was termed correlated thermal diffuse scattering (CTDS). The potential of CTDS as a direct surface structural tool has been fully explored for the Si(001)2×1 surface at 300 K in a very-grazing-incidence condition. Nearly 2π solid-angle, three-dimensional (3D) CTDS patterns were measured for an energy range of 500-2000 eV. The 3D Patterson functions obtained by Fourier inversion of the measured CTDS patterns clearly revealed the building blocks of the Si(001)2×1 surface, i.e., the bond orientations and lengths of the buckled Si dimers, within an accuracy of 1° and 0.1 Å, respectively.
|Number of pages||5|
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2000 Dec 15|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics