Direct mapping of the far and near field optical emission of nano-sized tapered glass fibers by an integrated SNOM/SF system

Ruggero Micheletto, Ken Nakajima, Martin Geisler, Masahiko Hara, Wolfgang Knoll

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    We describe a versatile scanning near-field optical microscope (SNOM) integrated with a shear force (SF) sample probe separation controller. The system works with special tapered optical fibers as the probing element. These fibers are fabricated by using a technique proposed earlier by Ohtsu et al. [M. Ohtsu, Optoelectronic devices and technology, 10 (2) (1995) 147]. We describe here the SNOM system we developed giving details on the fabrication of the fibers. Then we show the first direct bi-dimensional mapping of the optical emission of these tips as measured by our system in an original 2 tip configuration mode.

    Original languageEnglish
    Pages (from-to)514-519
    Number of pages6
    JournalApplied Surface Science
    Volume144-145
    DOIs
    Publication statusPublished - 1999 Apr

    Keywords

    • Optical fibers
    • SNOM
    • Shear force
    • Tapered fibers

    ASJC Scopus subject areas

    • Chemistry(all)
    • Condensed Matter Physics
    • Physics and Astronomy(all)
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films

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