TY - JOUR
T1 - Direct imaging of lithium ions using aberration-corrected annular-bright-field scanning transmission electron microscopy and Associated contrast Mechanisms
AU - He, Xiaoqing
AU - Gu, Lin
AU - Zhu, Changbao
AU - Yu, Yan
AU - Li, Chilin
AU - Hu, Yong Sheng
AU - Li, Hong
AU - Tsukimoto, Susumu
AU - Maier, Joachim
AU - Ikuhara, Yuichi
AU - Duan, Xiaofeng
PY - 2011/3
Y1 - 2011/3
N2 - The vast potential and fast development of implementing lithium-based batteries as an alternative power source to replace the existing lowefficiency and environmental-hazardous materials have urged an ever expediting pace for investigation of the corresponding characterization methods, in particular to observe lithium ions at atomic scale. Here we demonstrate a feasible annular-brightfield (ABF) imaging method based on aberrationcorrected scanning transmission electron microscopy to observe lithium ions directly at atomic resolution using LiFePO4, a positive electrode material routinely used, for a case study. In addition, we performed extensive image simulations, including the influences from specimen thickness, high tension, illumination angle, collection angle, material vacancy and lattice distortion, to compare and interpret explicitly the displayed image contrast and the attainable optimum operation conditions.
AB - The vast potential and fast development of implementing lithium-based batteries as an alternative power source to replace the existing lowefficiency and environmental-hazardous materials have urged an ever expediting pace for investigation of the corresponding characterization methods, in particular to observe lithium ions at atomic scale. Here we demonstrate a feasible annular-brightfield (ABF) imaging method based on aberrationcorrected scanning transmission electron microscopy to observe lithium ions directly at atomic resolution using LiFePO4, a positive electrode material routinely used, for a case study. In addition, we performed extensive image simulations, including the influences from specimen thickness, high tension, illumination angle, collection angle, material vacancy and lattice distortion, to compare and interpret explicitly the displayed image contrast and the attainable optimum operation conditions.
KW - Aberration-correction
KW - Annular-bright-field (ABF)
KW - Lithium-ion battery
KW - Scanning transmission electron microscopy (STEM)
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U2 - 10.1166/mex.2011.1006
DO - 10.1166/mex.2011.1006
M3 - Article
AN - SCOPUS:84859346170
SN - 2158-5849
VL - 1
SP - 43
EP - 50
JO - Materials Express
JF - Materials Express
IS - 1
ER -