Direct imaging of doped fluorine in LaFeAsO1-xFx superconductor by atomic scale spectroscopy

Tetsuya Tohei, Teruyasu Mizoguchi, Hidenori Hiramatsu, Yoichi Kamihara, Hideo Hosono, Yuichi Ikuhara

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    Abstract

    We report direct observation of fluorine ion dopants in the recently discovered LaFeAsO1-xFx superconductor, where the doping is critical for the superconductivity. Employing spectroscopic imaging based on scanning transmission electron microscopy, the spatial distribution of the doped fluorine ions, which are invisible in Z-contrast imaging, is clearly visualized with atomic-scale resolution. The observation directly proves that fluorine substitutes into the oxygen site in the superconducting LaFeAsO 1-xFx compound. Our results demonstrate the potential of the present method for revealing dopants undetectable by conventional microscopy imaging.

    Original languageEnglish
    Article number193107
    JournalApplied Physics Letters
    Volume95
    Issue number19
    DOIs
    Publication statusPublished - 2009 Nov 24

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

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    Tohei, T., Mizoguchi, T., Hiramatsu, H., Kamihara, Y., Hosono, H., & Ikuhara, Y. (2009). Direct imaging of doped fluorine in LaFeAsO1-xFx superconductor by atomic scale spectroscopy. Applied Physics Letters, 95(19), [193107]. https://doi.org/10.1063/1.3263148