Direct characterization of grain-boundary electrical activity in doped (Ba0.6Sr0.4)TiO3 by combined imaging of electron-beam-induced current and electron-backscattered diffraction

Katsuro Hayashi, Takahisa Yamamoto, Yuichi Ikuhara, Taketo Sakuma

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    4 Citations (Scopus)

    Abstract

    Simultaneous measurements of remote electron beam induced current (REBIC) and orientation imaging microscopy (OIM) in a scanning electron microscope (SEM) have been applied to a polycrystalline (Ba0.6Sr0.4)TiO3 with a positive temperature coefficient of resistivity (PTCR) to elucidate a grain-boundary character dependence of the potential barrier formation. The absence of electrical activity in a coherent Σ3 twin boundary is clearly imaged. The resistivity of individual grain boundaries estimated from a resistive contrast image is interpreted in terms of geometrical coherency, which is defined by the degree of coincidence in the reciprocal lattice points.

    Original languageEnglish
    Pages (from-to)1153-1156
    Number of pages4
    JournalJournal of the American Ceramic Society
    Volume87
    Issue number6
    DOIs
    Publication statusPublished - 2004 Jun

    ASJC Scopus subject areas

    • Ceramics and Composites
    • Materials Chemistry

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