TY - JOUR
T1 - Direct characterization of grain-boundary electrical activity in doped (Ba0.6Sr0.4)TiO3 by combined imaging of electron-beam-induced current and electron-backscattered diffraction
AU - Hayashi, Katsuro
AU - Yamamoto, Takahisa
AU - Ikuhara, Yuichi
AU - Sakuma, Taketo
PY - 2004/6
Y1 - 2004/6
N2 - Simultaneous measurements of remote electron beam induced current (REBIC) and orientation imaging microscopy (OIM) in a scanning electron microscope (SEM) have been applied to a polycrystalline (Ba0.6Sr0.4)TiO3 with a positive temperature coefficient of resistivity (PTCR) to elucidate a grain-boundary character dependence of the potential barrier formation. The absence of electrical activity in a coherent Σ3 twin boundary is clearly imaged. The resistivity of individual grain boundaries estimated from a resistive contrast image is interpreted in terms of geometrical coherency, which is defined by the degree of coincidence in the reciprocal lattice points.
AB - Simultaneous measurements of remote electron beam induced current (REBIC) and orientation imaging microscopy (OIM) in a scanning electron microscope (SEM) have been applied to a polycrystalline (Ba0.6Sr0.4)TiO3 with a positive temperature coefficient of resistivity (PTCR) to elucidate a grain-boundary character dependence of the potential barrier formation. The absence of electrical activity in a coherent Σ3 twin boundary is clearly imaged. The resistivity of individual grain boundaries estimated from a resistive contrast image is interpreted in terms of geometrical coherency, which is defined by the degree of coincidence in the reciprocal lattice points.
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U2 - 10.1111/j.1551-2916.2004.01153.x
DO - 10.1111/j.1551-2916.2004.01153.x
M3 - Article
AN - SCOPUS:3142658001
VL - 87
SP - 1153
EP - 1156
JO - Journal of the American Ceramic Society
JF - Journal of the American Ceramic Society
SN - 0002-7820
IS - 6
ER -