Direct characterization of grain-boundary electrical activity in doped (Ba0.6Sr0.4)TiO3 by combined imaging of electron-beam-induced current and electron-backscattered diffraction

Katsuro Hayashi; Takahisa Yamamoto; Yuichi Ikuhara; Taketo Sakuma

doi:10.1111/j.1551-2916.2004.01153.x

Direct characterization of grain-boundary electrical activity in doped (Ba_0.6Sr_0.4)TiO₃ by combined imaging of electron-beam-induced current and electron-backscattered diffraction

Katsuro Hayashi, Takahisa Yamamoto, Yuichi Ikuhara, Taketo Sakuma

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Simultaneous measurements of remote electron beam induced current (REBIC) and orientation imaging microscopy (OIM) in a scanning electron microscope (SEM) have been applied to a polycrystalline (Ba_0.6Sr_0.4)TiO₃ with a positive temperature coefficient of resistivity (PTCR) to elucidate a grain-boundary character dependence of the potential barrier formation. The absence of electrical activity in a coherent Σ3 twin boundary is clearly imaged. The resistivity of individual grain boundaries estimated from a resistive contrast image is interpreted in terms of geometrical coherency, which is defined by the degree of coincidence in the reciprocal lattice points.

Original language	English
Pages (from-to)	1153-1156
Number of pages	4
Journal	Journal of the American Ceramic Society
Volume	87
Issue number	6
DOIs	https://doi.org/10.1111/j.1551-2916.2004.01153.x
Publication status	Published - 2004 Jun

ASJC Scopus subject areas

Ceramics and Composites
Materials Chemistry

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10.1111/j.1551-2916.2004.01153.x

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Direct characterization of grain-boundary electrical activity in doped (Ba_0.6Sr_0.4)TiO₃ by combined imaging of electron-beam-induced current and electron-backscattered diffraction. / Hayashi, Katsuro; Yamamoto, Takahisa; Ikuhara, Yuichi et al.

In: Journal of the American Ceramic Society, Vol. 87, No. 6, 06.2004, p. 1153-1156.

Research output: Contribution to journal › Article › peer-review

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abstract = "Simultaneous measurements of remote electron beam induced current (REBIC) and orientation imaging microscopy (OIM) in a scanning electron microscope (SEM) have been applied to a polycrystalline (Ba0.6Sr0.4)TiO3 with a positive temperature coefficient of resistivity (PTCR) to elucidate a grain-boundary character dependence of the potential barrier formation. The absence of electrical activity in a coherent Σ3 twin boundary is clearly imaged. The resistivity of individual grain boundaries estimated from a resistive contrast image is interpreted in terms of geometrical coherency, which is defined by the degree of coincidence in the reciprocal lattice points.",

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Direct characterization of grain-boundary electrical activity in doped (Ba_0.6Sr_0.4)TiO₃ by combined imaging of electron-beam-induced current and electron-backscattered diffraction

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