Dimensional crossover effect in jc characteristics of chemical vapor deposition processed yba2cu3o7-δ films

Satoshi Awaji, Kazuo Watanabe, Norio Kobayashi, Hisanori Yamane, Toshio Hirai

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)


The critical current densities of chemical vapor deposition (CVD) processed YBa2Cu307-<5 films were resistively measured in fields up to 13 T and in a temperature range from 4.2 to 77.3 K. For B perpendicular to the c-axis (2?_L c), an anomaly in the temperature dependence of Jc was observed at Td = 50-60 K and the field dependence of Jc drastically changed at Td. Since Td was almost in agreement with the estimated dimensional crossover temperature Tco, it is sug gested that the change of dimensionality influences the Jc properties.

Original languageEnglish
Pages (from-to)L1532-L1535
JournalJapanese journal of applied physics
Issue number11
Publication statusPublished - 1992 Nov


  • 2D Flux pinning
  • 3D conventional flux pinning
  • Anisotropy
  • Chemical vapor deposition
  • Critical current density
  • Dimensional crossover
  • YBaCu0_^ film

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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