This paper reports on the factors that dominate diffusion phenomena in post-annealed CoCrPt media with various cap-layer elements X. Hf- and Zr-capped media were found to show low diffusion temperature and have thin reacted layer in this experiments. These results are explained with following relationships revealed by detailed analyses of boundary diffusion and interdiffusion: 1) X with high melting point in cap-layer hardly starts boundary diffusion and interdiffusion, 2) X-capped media with higher melting point of CoX compound forms thinner reacted layer, and 3) X with low enthalpy of Co-X formation lead to low diffusion temperature.
- Perpendicular magnetic recording media
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering